Christy De Meyer
Formula used:
I(l)/ I0(l)=
exp{-(m/r)l rx}
or:
10/108 = exp{-(230.11,3).x}
Usually the beam stop is thicker because the X-ray beam is unfiltered and non-monochromated. As a result, X-rays with another energy (higher as well as lower) have to be captured too.
This can be overcome by using a silicon single crystal sample holder covered by a very thin
"coating" of the organic powder (dusting the powder on the holder.)
Result: the peaks will be much sharper, but the intensities will be much less
reliable and smaller.
The characteristic feature of synchrotron radiation that is particularly beneficial for powder diffraction studies of organic powder samples,is the possibility to select the incident X-ray wavelength from the highly intense continuous synchrotron radiation source. Another wavelength then the usual Cu Ka1 radiation can be used as monochromatic indicent radiation. So the wavelength for organic materials can be chosen slightly above or well below any of the absorption edges of the elements in the sample.
The two design features of synchrotron angle-despersive powder diffractometers used: Debye Scherrer and Flat plate.
E = 12.398 / l
and
n.l = 2.d.sinq
results in:
C = E.d.sinq
(E in keV, d in Å, the C = 6,1993keVÅ)
So, d = C / (E.sinq)
for E = 20keV and 2q = 3.5°
or q = 1.75°
is d = 10.15Å
for E = 100keV and 2q = 3.5°
or q = 1.75°
is d = 2.03Å
Si(111) - d = 3.3136Å
l = 2.d.sin(qM/2)
wavelength l0 = 0.75Å
wavelength l1 = 0.65Å
Problem: change of the angle 2qM
Answer:
sin(qM0/2) = 0.75Å/(2x3.3136Å)
qM0 = 0.2268 rad
sin(qM1/2) = 0.65Å/(2x3.3136Å)
qM0 = 0.1965 rad
So the change in 2q = - 0.0303 rad
or the change in 2q = - 1° 44'