Reference Material Only
In order to be in a position to make confident statements to the court regarding laboratory X-ray powder diffraction data, you must carefully check the diffractometer before, during, and after any measurements. The following calibration data, based on the NBS 640b silicon standard, was presented as part of the evidence in this particular case study. Note the quality of the fit between observed and calculated positions.
Peak No. | hkl | 2θ(Obs) (°) | 2θ(Calc) (°) | Δ2θ (°) | Intensity | Width (°) |
---|---|---|---|---|---|---|
1 | 111 | 28.439 | 28.438 | −0.001 | 558 | 0.070 |
2 | 220 | 47.300 | 47.300 | 0.000 | 258 | 0.081 |
3 | 311 | 56.120 | 56.120 | 0.000 | 130 | 0.091 |
4 | 400 | 69.127 | 69.129 | −0.002 | 26 | 0.100 |
5 | 331 | 76.377 | 76.376 | 0.001 | 49 | 0.101 |
6 | 422 | 88.034 | 88.032 | 0.002 | 56 | 0.111 |
7 | 511 | 94.954 | 94.955 | −0.001 | 27 | 0.125 |
8 | 440 | 106.708 | 106.714 | 0.006 | 18 | 0.136 |
9 | 531 | 114.100 | 114.099 | 0.001 | 30 | 0.147 |
10 | 620 | 127.556 | 127.556 | 0.000 | 22 | 0.186 |
2θ zero error = −0.007(1)°
© Copyright 1997-2006. Birkbeck College, University of London. |
Author(s):
Jeremy Karl Cockcroft Martin Vickers |